Separation modes in microcontacts identified by the rate dependence of the pull-off force

Title:
Separation modes in microcontacts identified by the rate dependence of the pull-off force
Creator:
Chen, L. (Author)
McGruer, Nicol E. (Author)
Adams, George G. (Author)
Du, Yan (Author)
Language:
English
Publisher:
American Institute of Physics
Copyright date:
2008
Type of resource:
Text
Genre:
Articles
Format:
electronic
Digital origin:
born digital
Abstract/Description:
We report the observation of two distinct modes of rate-dependent behavior during contact cycling tests. One is a higher pull-off force at low cycling rates and the other is a higher pull-off force at high cycling rates. Subsequent investigation of these contacts using scanning electron microscopy (SEM) demonstrates that these two rate-dependent modes can be related to brittle and ductile separation modes. The former behavior is indicative of brittle separation, whereas the latter accompanies ductile separation. Thus by monitoring the rate dependence of the pull-off force, the type of separation mode can be identified during cycling without interrupting the test to perform SEM.
Comments:
Originally published in Applied Physics Letters, v.93 no.5 (2008). DOI:10.1063/1.2967855
Subjects and keywords:
Microelectromechanical systems
Electric switchgear
Scanning probe microscopy
brittleness
ductility
electrical contacts
micromechanical devices
scanning electron microscopy
Electrical and Electronics
Nanoscience and Nanotechnology
Permanent Link:
http://hdl.handle.net/2047/d20000886

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